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Latest update： 19/09/2023 12:38:10
Photonic Edge Inc.
Game change in high-frequency measurement using photonics (optical technology) Toward a future in which anyone can participate in the high-frequency industry
The field spatial distribution of millimeter-wave terahertz waves is visualized using proprietary optical technology and EO sensor probes. We have unqie measurement technology.
- Millimeter-wave and terahertz-wave band measurement system
Near-field measurement system for millimeter-wave and terahertz-wave antennas
This antenna measurement system supports 10 GHz to 330 GHz. In the 300 GHz band, our unique EO sensor probe enables near-field measurement. Our EO sensor probes are metal-free so that the disturbance effect of the electric field is very small and amplitude and phase can be measured accurately. This eliminates the need for far-field measurements and eliminates the need for large anechoic chambers and fields. The amplitude and phase near the antenna can be measured, so the correct far-field can be obtained by the operation. As an option, it is also possible to provide measurement methods (S/W) that greatly reduce the number of measurements, called single cut and multi-cut. This can greatly reduce the measurement time. (*This S/W is provided by 7Gaa K.K., a partner company. 7Gaa is a technology transfer venture from the National Institute of Advanced Industrial Science and Technology.) The EO sensor probe is very light because it is a fiber-optic sensor probe. Therefore, it is easy to incorporate it into a simple robot arm or an automatic linear motion stage. Simplifying the sweep equipment for scanning is also a major advantage and an important factor in simplifying the measurement environment.
Millimeter wave band material measurement system
This material measurement system supports 10 GHz to 330 GHz. (110 GHz to 330 GHz is under development) We analyze the S parameter and complex permittivity in free space. The greatest feature is that it does not require VNA with its own signal processing technology. In addition, it is composed of RF circuits developed in-house, so it can be constructed at very low cost compared to the conventional free space method system using VNA. (This system consists of an electric multiplier circuit and a mixer, but it is possible to measure the phase without using a VNA.) Do you want to measure materials and introduce equipment? Do you want to use it easily for research and development purposes and inspection purposes? Do you want to apply to in-line inspection? This system is ideal for general-purpose applications. Our free-space radio environment does not require the construction of conventional antenna lenses. Because it is possible to simplify the space with our unique radio wave control based on optical technology, it can be installed at measurement points that were previously inaccessible. Theoretical calculations are also possible for the transmittance and reflectance of the dielectric transmitting material at oblique incidence.
Millimeter-wave/terahertz-wave transmitter, receiver, amplifier, etc.
We manufacture transmitters and receivers in the millimeter-wave and terahertz-wave band. At our company, in the process of technological development such as antenna measurement, we also develop and assemble some RF circuits in-house. We provide a multiplier for millimeter-wave generation and a mixer for reception.